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. 2015 May 9;22(Pt 4):980–994. doi: 10.1107/S1600577515005780

Figure 11.

Figure 11

(a) Profile of the deviatoric strain components Inline graphic and Inline graphic and (b) profile of the deviatoric stress components Inline graphic and Inline graphic, obtained by the Laue-DIC method on a Si single-crystal during bending at 50 N. In (b), the line referring to as ‘FE’ is the finite-element results for Inline graphic and Inline graphic.