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. 2015 May 9;22(Pt 4):980–994. doi: 10.1107/S1600577515005780

Figure 12.

Figure 12

(a) Profile of the shear strain components Inline graphic, Inline graphic and Inline graphic and (b) profile of the shear stress components Inline graphic, Inline graphic and Inline graphic obtained by the Laue-DIC method for the Si single-crystal. Case 50 N.