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. 2016 Feb 24;16(3):2040–2046. doi: 10.1021/acs.nanolett.6b00024

Figure 3.

Figure 3

Experimental verification of the FP0 cutoff resonance mode by the dispersion properties of the resonant peaks. (a) Schematic of glancing-angle ion polishing to reduce the cavity length. (b,c) The change in the transmitted spectra as glancing-angle ion polishing time increases and film thickness decreases from a coaxial aperture array with a 10 nm gap width and diameters of 100 and 250 nm, respectively.