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. 2016 Mar 15;6:22664. doi: 10.1038/srep22664

Table 1. Film thickness during etching followed by pattern transfer process (Bruker’s DektakXT™ Stylus Profilometer).

Before etchthickness (nm) Etch time(second) After etchthickness (nm) Thickness after removal of polymerfilm from etched surface (nm)
103 60 350 307
118 120 698 645