Figure 2. FairSIM reconstruction of data sets obtained on a simple SLM-based SR-SIM setup.

A glass surface with 200 nm Tetraspeck beads was used as test sample, excitated at 642 nm wavelength. In contrast to the (Wiener filtered) wide-field image (a), the SR-SIM reconstruction by fairSIM (b) yields clearly distinct beads. This can be found quantitatively from the cross-section plots, given for a single bead in c and two close-by beads (indistinguishable in wide-field mode) in d. A simplified sketch of the set-up used is given in e. Scale bar, 5 μm, inset 1.2 μm.