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. Author manuscript; available in PMC: 2016 Mar 23.
Published in final edited form as: ACS Appl Mater Interfaces. 2016 Feb 16;8(8):5082–5092. doi: 10.1021/acsami.5b10531

Figure 1.

Figure 1

Characterization of nanotopographies. (a) SEM micrographs of the nanotopographies. The nanotopographies in the same row have the same feature size (the line width of NGs and the diameter of NPs). The nanotopographies in the same column have the same ratio of spacing (the edge-to-edge spacing for NGs and the center-to-center spacing for NPs) to feature size. The inset provides the enlarged image. All scale bars are 1 μm. (b) AFM 3-D image and 2-D profile of NG 500-3X-560 (left) and NP 500-1.9X-150 (right).