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. 2016 Mar 7;2(3):169–174. doi: 10.1021/acscentsci.6b00022

Figure 2.

Figure 2

Grazing-incidence X-ray diffraction of Cu/CNT electrodes. (a) X-ray diffraction patterns for the as-deposited and annealed Cu/CNT electrodes. The very small peaks at 2θ = 41.7° are attributed to native oxide formed during sample preparations. (b) Correlation between the microstrain extracted from Williamson–Hall analysis and the GB surface density.