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. 2016 Apr 12;6:24088. doi: 10.1038/srep24088

Figure 3. Measure of detectability R in the parameter plane of noise.

Figure 3

The parameters characterizing the properties of measurement noise are σ and η. The model system has fixed βy,x = 0.1 and different values of βx,y: (a) 0.01, (b) 0.02, (c) 0.05, and (d) 0.07. Other parameters are rx = 3.8, ry = 3.5 and L = 1001. The values of the threshold ηc = βx,y/βy,x above which noise enhancement of CCM index measure occurs are marked by the dashed lines.