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. 2016 Apr 12;11:194. doi: 10.1186/s11671-016-1397-6

Fig. 2.

Fig. 2

Schematic representation of the periodic INP arrays with back reflector (a), showing all the critical dimensions used in the simulation. Comparison of the reflection spectra of structured 20-μm-thick c-Si thin films with front-sided INP arrays with periodicity of 300, 670, and 1400 nm, respectively, for experiments (b) and simulations (c)