Figure 2. Experimental results.

Measured (a–c) transmission and (d–f) reflection amplitudes, (g–i) transmission and (j–l) reflection phase for three different wavelengths: (a,d,g,j) 1,310 nm, (b,e,h,k) 1,450 nm and (c,f,i,l) 1,530 nm. All the measurements are performed for the range of incident angles 0–60°and are plotted versus wave vector components k_x and k_y normalized by the length of the wave vector in air k_air. Horizontal axes correspond to TM-polarized illumination. Vertical axes correspond to TE illumination. Square apertures for the transmission amplitude and phase measurements show the numerical aperture limited by the size of the windows in the supporting silicon wafer.