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. 2016 Apr 21;6:24785. doi: 10.1038/srep24785

Figure 1.

Figure 1

(a) Schematic for pure V and V-graphene nanolayers with repeat layer spacing (λ) of 110 nm and 300 nm. (b) Stress-strain curve determined from nanopillar compression testing of pure V, and V-graphene nanolayers with 110 nm and 300 nm repeated layer spacings. (c) TEM image showing the nanocrystalline nature of V-graphene with 300 nm repeated layer spacing. (d) SRIM ion trajectories of He+ irradiation on V thin film under condition of 120 keV. (e) TEM image showing the radiation induced grain growth after He+ irradiation.