Figure 7. IR microscopy of sample #3.
(a) Optical image, showing the changing microstructure along the sample. (b) Number of graphene layers measured by XPS as a function of the position along the sample length (red line). (c) Experimental IR reflectance microscopy on each spot at locations indicated in (a). (d) Fit to the experimental spectra in (c). The extracted number of layers is indicated on the graph. Experimental (e) and computed (f) differential reflectance spectra at locations indicated in (a). Inset: Reflectance (c,d) and differential reflectance (e,f) spectra above 1000 cm−1. The shaded area in the inset of (e) indicates the graphene phonon E1u.
