Table 1. Best-fit parameters obtained from the IR reflectance model for each FEG/MEG sample.
| Sample # | NIR | NXPS (±20%) | EF (meV) | τ (fs) | N(1012 cm−2) | μ (cm2/Vs) |
|---|---|---|---|---|---|---|
| 1 | 3.3 ± 1.0 | 2.4 2.0 | 170 | 16 | 7.0 | 518 |
| 2 | 3.4 ± 1.0 | 1.7 1.9 | 170 | 27 | 7.2 | 862 |
| 3 | 5.0 ± 1.0 | 3.0 3.5 | 65 | 29 | 1.6 | 1996 |
| 4 | 24 ± 3 | 19.1 22.4 | 55 | 23 | 5.3 | 854 |
| 5 | 30 ± 3 | 29.3 21.7 | 38 | 20 | 3.2 | 961 |
| 6 | 53 ± 4 | >35 | 40 | 5 | 6.2 | 172 |
| 7 | 82 ± 6 | >35 | 25 | 38 | 3.8 | 1680 |
The two results given for NXPS correspond to two different regions of the samples.