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. 2016 Apr 22;6:24301. doi: 10.1038/srep24301

Table 1. Best-fit parameters obtained from the IR reflectance model for each FEG/MEG sample.

Sample # NIR NXPS (±20%) EF (meV) τ (fs) N(1012 cm−2) μ (cm2/Vs)
1 3.3 ± 1.0 2.4 2.0 170 16 7.0 518
2 3.4 ± 1.0 1.7 1.9 170 27 7.2 862
3 5.0 ± 1.0 3.0 3.5 65 29 1.6 1996
4 24 ± 3 19.1 22.4 55 23 5.3 854
5 30 ± 3 29.3 21.7 38 20 3.2 961
6 53 ± 4 >35 40 5 6.2 172
7 82 ± 6 >35 25 38 3.8 1680

The two results given for NXPS correspond to two different regions of the samples.