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. 2016 Mar;472(2187):20150486. doi: 10.1098/rspa.2015.0486

Figure 5.

Figure 5.

(a) Orientation imaging microscopy using electron back scattered diffraction of treated surface, (b) variation in grain size δ15° with respect to depth d from treated surface. Dashed line in (a) shows orientation of dislocation structures. Arrow in (a) points at zone featuring poorly aligned dislocation structures. (Online version in colour.)