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. 2016 Apr 26;6:25011. doi: 10.1038/srep25011

Figure 1. Experimental and calculated reflectance spectra of the device.

Figure 1

(a) Schematic of the device. (b) The normalized experimental reflectance spectra for different thicknesses of Ge on Au (c). The calculated reflectance spectra for the same thicknesses of Ge on Au. (d) Corresponding reflectance minimum plotted for different thicknesses of Ge. The Bright-field microscope images as a function of Ge thickness are inserted next to each plotted data point. All images are captured at 50× magnification.