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. 2016 Apr 26;6:25011. doi: 10.1038/srep25011

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Copyright © 2016, Macmillan Publishers Limited

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(a) A bright-field image showing defects in graphene along the Cu grain boundaries. (b) Observation of grain boundaries in Graphene along the Cu grain boundary (indicated with yellow arrows). This Bright-field (BF) image has been post processed to improve visualization. The boundaries encircling grains (GGBs) appear yellow in the image. We clearly see that the typical grain sizes are about 2–5 μms. (c) A post processed BF image where GGBs, tears in graphene, triple junction and folds along the Cu rolling marks are clearly visible. The Ge beneath the GBs/other defects etch faster (pinkish region) than at the grains themselves (large blue regions). (d) Shows the evolution of the appearance of GGBs with time. The raw images of (b,c) are shown in the [SI text, section 8].