Figure 1.

Demonstration and characterization of surface‐initiated polymer brush growth from functionalized 2D silicon surfaces. A) XPS analysis of pOEGMA grafting from a silicon wafer functionalized with APTES‐Ini with controls (dashed bottom trace), silicon functionalized with APTES‐Ini that underwent polymerization with no reducing agent, ascorbic acid (AScA, dotted middle trace), and pOEMGA grafting from a silicon wafer (top trace, left). Conversion by ¹H‐NMR (X) is included above each trace. Si‐APTES‐pOEGMA sample with the C1s peaks fitted (right). B) AFM scratch test and C) representative profile of pOEGMA grafted from silicon wafers. D) Water contact angle measurement of a silicon wafer functionalized with (i) APTES‐Ini and (ii) following grafting of pOEGMA.