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. 2016 Apr 28;6:24873. doi: 10.1038/srep24873

Figure 3. Aberration corrected-BF/HAADF-STEM imaging.

Figure 3

APC were cut in ultra-thin sections of 90–95 nm for ultra-structural examination and location of electrodense materials, samples were not stained with heavy metals to avoid noise signals. (A) Low magnification of APC thin sections identifying presence of electrodense areas and spots. (B) High magnification STEM of selected area in (A), locating different high-contrast spots corresponding to particles into APC (yellow arrows, labeled 1 and 2). Imaging was carried out with JEOL ARM-200F operated in STEM mode at accelerating voltage of 80 kV, to avoid or reduce radiation damage of protein-based aggregates.