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. 2016 Apr 28;6:24873. doi: 10.1038/srep24873

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High-contrast spots corresponding to iron oxide particles within APC (yellow arrows, labeled as 1 and 2 in Fig. 2). (A) BF-STEM spherical Fe nanoparticle. (B) HAADF-STEM spherical Fe nanoparticle. (C) Detail of surface of Fe nanoparticle. (D) Nano-beam electron diffraction. Elongated particles: (E) BF-STEM non-spherical Fe nanoparticle. (F) HAADF-STEM non-spherical Fe nanoparticle. (G) Detail of periodic surface of Fe nanoparticle. (H) Fast Fourier Transform (FFT) pattern of selected area in (G). Imaging with JEOL ARM-200F, operated in STEM mode at accelerating voltage of 80 kV.