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. 2001 Dec 1;106(6):1141–1154. doi: 10.6028/jres.106.061

Fig. 6.

Fig. 6

Comparison of the experimentally determined EXAFS and DAFS In-As and Ga-As bond lengths in pseudomorphic Ga1−x Inx As alloys grown on GaAs(001) (squares) and InP(001) (circles) with the results of the theoretical, random-cluster calculations. The dashed lines are the calculated cubic (bulk) bond lengths, and the solid lines are the calculated tetragonal (strained) bond lengths. Results for the different substrates are as indicated. Note that the bulk and strained bond lengths coincide for the lattice-matched, zero strain composition.