Figure 2.

Schematic layout of (a) experimental setup for angle-resolved reflectivity and photoluminescence measurements, and (b) collection angles θ_x and θ_z, and polarization direction with respect to the periodic array and entrance slit of spectrometer oriented along the X-axis. Experimental and 3D-FDTD calculated angle- and polarization-dependent reflectivity spectra of samples with a nanodisk pitch of 670 nm without (c,d) or with (e,f) SWNTs. Analytical dependencies for corresponding Rayleigh anomalies are indicated with white/black dotted lines.