Skip to main content
. 2016 Apr 7;16(5):3005–3013. doi: 10.1021/acs.nanolett.5b05216

Figure 5.

Figure 5

(a) Rph of M–SLG–Si and reference M–Si PDs as a function of reverse bias for different optical powers coupled to the Schottky region; (b) Rph of M–SLG–Si and reference M–Si PDs for 0 < VR < 3 V. Colored solid lines show a fit of the bias dependent Rph based on combined thermionic-field emission and avalanche multiplication processes.