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. 2016 May 13;7:11591. doi: 10.1038/ncomms11591

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(a) Selected area electron diffraction pattern; (b) High-resolution TEM image; and (c) HAADF-STEM image of the amorphous SiO. Scale bar, 2 nm. (d) EELS profiles (Si-K edge) taken from the dark (blue circle), bright (red circle) and interfacial (black circle) regions in the HAADF-STEM image. Standard EELS profiles of amorphous Si and SiO₂ were extracted from the literature¹¹. Scale bar, 2 nm.