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. 2016 Mar 17;28(8):2557–2572. doi: 10.1021/acs.chemmater.5b04461

Figure 10.

Figure 10

ToF-SIMS chemical imaging of a silicon electrode FIB cross section obtained by in situ FIB cut performed after the first lithiation in Li-ion configuration, a) Overlay of Li+, Si+, Cu+ maps. (b) Li+ maps. (c) F maps. (d) P+ maps. Dashed white lines delimitate the cross-section wall.