Skip to main content
. 2016 Mar 17;28(8):2557–2572. doi: 10.1021/acs.chemmater.5b04461

Figure 9.

Figure 9

In situ FIB cut of a silicon electrode performed after the first delithiation in Li-ion configuration, secondary electron imaging of: (a) Top view of the FIB cut and electrode surface. (b) Entire depth of the electrode.