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. 2016 May 20;7:11619. doi: 10.1038/ncomms11619

Figure 5. Demonstration of the robustness of topological protection against defect variations.

Figure 5

Simulated (a) and observed (c) field pattern when removing a lattice ring and its surrounding coupling rings (shown in e). Simulated (b) and observed (d) field pattern when the height of metallic rods of a lattice ring is decreased to s=4.3 mm (shown in f). All other rods maintain their height h=5 mm. Metal is modelled as a perfect electric conductor in simulation.