Table 1.

Fit parameters of charge recombination kinetics

	Sample	T (K)	Fit parametersa
			Nanosecond experiment @ 690 nm						Femtosecond experiment @ 400–700 nm
			τ 1 (ns)	A 1	τ 2 (ns)	A 2	A 0	τ cav (ns)	τ 1 (ns)	A 1	τ 2 (ns) (fixed)	A 2
2-exp	WTb	298	2.4	0.34	13	0.61	0.048	9.2	1.6	0.54	20	0.46
		78	3.8	0.29	26	0.62	0.093	18.9	–		–
	ELL	294	1.0	0.92	20	0.07	0.007	2.3	0.68	0.77	20	0.23
		78	1.2	0.88	20	0.11	0.015	3.3	–		–
	YLH	294	1.5	0.57	15	0.41	0.021	7.1	0.49	0.60	20	0.40
		78	1.2	0.59	20	0.35	0.053	8.1	–		–
	GML	296	–	–	–	–	–	–	1.6	0.24	20	0.76
1-exp	GML	296	16.5	0.84	–	–	0.16	16.5	–	–	–	–
		78	23.7	0.80	–	–	0.20	23.7	–	–	–	–

^aIn the case of the nanosecond experiments, two- and one-exponential fits were performed according to the formula $\mathrm{\Delta }A={\sum }_{i=1}^N{A}_{i}exp(-t/{\mathit{\tau }}_i)+A_0$ (N = 1 or 2) in a 200-ns temporal window (100-ns in the case of the WT RC) and the fitted kinetics are shown in Fig. 4. In the case of the femtosecond experiments, the lifetimes τ ₁ and τ ₂ come from the global analysis (Fig. 5), whereas the amplitudes A ₁ and A ₂ were taken from the target analysis (see Fig. 6) and are consistent with the relative amplitudes of the two phases of charge recombination shown in Fig. 5e–h

^bData taken from Gibasiewicz et al. (2013b)

^cFor two-exponential fits τ _av = (τ ₁ A ₁ + τ ₂ A ₂)/(A ₁ + A ₂). The estimated experimental error of the fit parameters obtained for the nanosecond experiment is ±20 %