Figure 3.

The probe is placed (a) in contact with the highly absorbing (μ_a ≥ 100 cm⁻¹ for 450–750 nm) inside a 5 mL beaker and translated upwards in 50 μm increments to (b) acquire sDRS data from a calibration phantom (C.P. 11) at a 374 μm SDS. (c) Representative data from the 374 μm SDS shows the percentage of photons not reaching the highly absorbing layer as a function of depth for C.P. 11 at 585 nm. Sampling depth is defined as the depth reached by 50% of photons.