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. 2016 Apr 18;49(Pt 3):784–797. doi: 10.1107/S1600576716003757

Figure 5.

Figure 5

The effect of length changes of helical wire structures on the calculated Fourier transforms of stretched and relaxed helices. Intensities at Ψ = 0 are shown in the left-hand panels, unless otherwise specified, while the phases at the specified Ψ are shown in the middle and the intensities averaged over all Ψ are on the right-hand side. In each panel, the left half is the relaxed pattern (undistorted helices) and the right half is the stretched pattern (distorted helices). The following helical parameters are used: six Bessel functions used to calculate the total transform on any given layer line, subunit distance 27.3 Å, length of one pitch 59.15 Å, radial position of a subunit (helix radius) 25 Å, 13 subunits in six turns. In all cases, the strain, Δ∊, increases linearly from 0 to 20% for different helix lengths: (a) a half pitch, Ψ = π/2; (b) one pitch; (c) two full pitches; (d) three full pitches; and (e) six full pitches. The change of strain, Δ∊, increases linearly from zero to a maximum strain of 20% over the length of the helical wire, Inline graphic, thus causing the amount of stretch per pitch to decrease with increasing Inline graphic. Different pitches are chosen to best visually show the differences between the stretched and relaxed helices. Note that the higher-order layer lines show a larger distortion of the predicted X-ray reflections (including a reduction in intensity of the layer lines) and they are more prominent for longer helices. In the phase images, white indicates a phase of π radians and black a phase of −π radians.