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. 2016 May 24;7:11683. doi: 10.1038/ncomms11683

Figure 4. Iodide redistribution after light soaking.

Figure 4

(a) A series of time-resolved photoluminescence decays from a CH3NH3PbI3 film measured over time under illumination before time-of-flight secondary-ion-mass spectrometry (ToF-SIMS) measurements. The sample was photoexcited with pulsed excitation (470 nm, 1.2 kJ cm−2). (b) ToF-SIMS image of the iodide (I-) distribution summed through the film depth (the image has been adjusted to show maximum contrast), scale bar, 10 μm. (c) Line scan of the blue arrow in b to show the iodide distribution (right axis). The measured spatial profile of the illumination laser (blue) is shown on the left axis.