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. 2016 Jun 8;13:28. doi: 10.1186/s12989-016-0140-x

Fig. 1.

Fig. 1

Imaging of CNC using AFM height (a) and amplitude (b) modes, and SEM (c). The EDX spectrum is also shown (d), along with the calculated weight percentages (Wt%) and atomic percentages (At%). Silicon elemental contributions are ignored in the EDX analysis. Scale bars are 200 nm for a and b