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. 2016 Jun 9;7:11623. doi: 10.1038/ncomms11623

Figure 1. MnTe thin films properties.

Figure 1

(a) Cross-sectional HAADF image taken along the Inline graphic zone axis resolving the individual atomic columns of Mn (magenta) and Te (green). The inset shows the atomic positions including the Mn magnetic moments in the ordered antiferromagnetic state and the unit cell size is indicated by a white line. Scale bar, 5 nm. (b) Absorption coefficient of MnTe in the mid-infrared and visible spectral range extracted from transmission measurements for three different film thicknesses. (c) SQUID magnetic field sweeps for in-plane and out-of-plane field directions at 5 K. The diamagnetism of the substrate is dominating the behaviour. (d) SQUID magnetic field sweeps for several indicated field directions at 5 K with the diamagnetism of the out-of-plane measurement subtracted from all the measured traces. (e) Micrograph of the Hall bar geometry indicating the longitudinal (RXX) and transverse (RXY) resistances together with the definition of the magnetic field angle Inline graphic. (f) Temperature-dependent longitudinal and transverse resistance measurement showing a peak near the transition temperature in the longitudinal resistance.