Figure 3.

Voltage-dependent (C_v) and linear (C_lin) components of OHC capacitance simultaneously measured with the multi-dual-sine approach. (A) C_v displays a low-pass frequency dependence, which is unexpected for a fast two-state Boltzmann process. Differences between 1 mM (red circles, n = 6) and 140 mM (blue circles, n = 17) chloride conditions also show chloride-dependent frequency effects. (B) C_lin is flat across frequency, as expected. The frequency independence of C_lin demonstrates that calibration of system responsiveness was accurately performed. (C and D) V_h and z are also stable across frequency. Error bars depict the mean ± SE, which in some cases is obscured by symbols. The solid lines in (A) are exponential, and those in (B)–(D) are linear fits for presentation. To see this figure in color, go online.