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. 2016 May 27;72(Pt 6):854–857. doi: 10.1107/S2056989016008343

Table 2. Experimental details.

  Phase 1 Phase 2
Crystal data
Chemical formula Na+·C6H7O7 Si
M r 214.10 28.09
Crystal system, space group Orthorhombic, P212121 Cubic, F d Inline graphic m
Temperature (K) 300 300
a, b, c (Å) 7.4527 (3), 7.7032 (3), 13.4551 (4) 5.43105, 5.43105, 5.43105
α, β, γ (°) 90, 90, 90 90, 90, 90
V3) 772.45 (5) 160.20
Z 4 8
Radiation type Kα1, Kα2, λ = 1.540629, 1.544451 Å Kα1, Kα2, λ = 1.540629, 1.544451 Å
Specimen shape, size (mm) Flat sheet, 25 × 25 Flat sheet, 25 × 25
 
Data collection
Diffractometer Bruker D2 Phaser Bruker D2 Phaser
Specimen mounting Bruker PMMA holder Bruker PMMA holder
Data collection mode Reflection Reflection
Scan method Step Step
2θ values (°) min = 5.042 2θmax = 100.048 2θstep = 0.020 min = 5.042 2θmax = 100.048 2θstep = 0.020
 
Refinement
R factors and goodness of fit R p = 0.063, R wp = 0.084, R exp = 0.024, R(F 2) = 0.0780, χ2 = 12.180 R p = 0.063, R wp = 0.084, R exp = 0.024, R(F 2) = 0.0780, χ2 = 12.180
No. of parameters 76 76
No. of restraints 29 29

The same symmetry and lattice parameters were used for the DFT calculation. Computer programs: DIFFRAC.Measurement (Bruker, 2009), Powder4 (Dragoe, 2001), DASH (David et al., 2006), GSAS (Larson & Von Dreele, 2004), EXPGUI (Toby, 2001), DIAMOND (Crystal Impact, 2015) and publCIF (Westrip, 2010).