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. 2016 Jun 16;7:11981. doi: 10.1038/ncomms11981

Figure 1. X-ray diffraction and XPS.

Figure 1

(a) X-ray diffraction patterns of α-Ni(OH)2 and Ni0.75V0.25-LDH. XPS measurements (=1,486.6 eV) on the Ni0.75V0.25-LDH powder deposited on a FTO conductive glass: (b) Ni 2p (c) O 1s and V 2p core-level spectra, and (d) zoom on the V 2p core-level spectrum.