Table 4.
Category | Error source | Error contribution (μm) | |
---|---|---|---|
Systematic | Random | ||
Microsphere sensing | Imperfect scan conditions: scan direction unequal-size spheres | 0.0011 0.0002 |
|
E-beam exposure | 0.0009 | ||
SEM resolution and E-beam wander | 0.0008 | ||
Row length measurements | Stage travel sampling interferometer least count | 0.0009 0.0005 |
|
Microsphere grouping | Sphere flattening on contact air gaps between spheres | 0.0020 0.0020 |
|
Sample size (N=120) | Small sample with non-zero σD | 0.0055 | |
Totals | 0.0030 | 0.0057 |
Uncertainty in μm. Measured (after corrections, see Sec. 4.2.5): 2.990 μm.