Figure 5. Reflection from random-phase GSP-based metasurfaces.
(a,b) Representative scanning electron microscopy images of the fabricated GSP-based metasurfaces featuring 4 and 16 different nanobrick elements, respectively, thus approximating random-phase metasurfaces with fully correlated and statistical independent reflection phases for orthogonal polarisations. (c,d) Measured reflectivity as a function of wavelength and NA for the metasurfaces in (a,b) respectively. The incident light is x-polarised. The insets are bright-field images of the metasurfaces and surrounding gold film.