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. 2016 Jun 23;18:171. doi: 10.1007/s11051-016-3474-2

Fig. 3.

Fig. 3

AFM images of silica nanoparticles deposited onto a silicon substrate. Non-touching particles of size class A (top left) and size class B (bottom left) were automatically detected (coloured) and their height measured. Graphical representations of the corresponding number-weighted PSDs are given on the right