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. 2015 Aug 6;6:7961. doi: 10.1038/ncomms8961

Figure 4. Excitation energy dependent TR kinetics and carrier density distribution profiles.

Figure 4

(a) The normalized TR kinetics recorded at 2.38 eV for three different pump energies. The normalized surface carrier density dynamics shows the same decay trend as the TR kinetics. The black dashed lines represent the global fitting based on the carrier diffusion model. (b) Normalized carrier density distribution profiles for 2.48 eV pump at indicated delays in the single crystal. Inset shows the distributions within 100 nm from the surface, and the red shade represents the probe (at 2.38 eV) detection depth.