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. 2004 Jul 15;101(30):10937–10942. doi: 10.1073/pnas.0401742101

Table 1. Crystallographic statistics.

Data set SecA (apo)* SecA (ADP)*
Resolution, Å 2.18 2.9
Unique reflections 58,197 25,014
I/Iσ 28.37 (2.65) 20.93 (2.08)
Completeness, % 98.8 (97.7) 99.3 (94.0)
Rsym 0.063 (0.516) 0.073 (0.479)
Rcryst, % 24.0 (31.3) 22.8 (38.6)
Rfree,§ % 27.3 (33.5) 29.2 (45.2)
rms deviation bond angles, ° 1.1 1.3
rms deviation bond length, Å 0.007 0.008
Average B factor 56.1 61.5
Most favored angles, % 90.5 88.3
Allowed angles, % 8.8 10.4
Generously allowed angles, % 0.7 1.3
*

Values in parentheses refer to data in the highest-resolution shell (2.26-2.18 Å and 3-2.9 Å in the apo and ADP datasets, respectively).

Rsym = ΣhklΣi|Ii(hkl) – I(hkl)|/ΣhklΣi|Ii(hkl), where I(hkl) is the average intensity.

Rcryst = ΣhklFobs| – k|Fcalc∥/Σhkl|Fobs|, where Fcalc and Fobs are the calculated and observed structure factor amplitudes, respectively.

§

Rfree is the same as Rcryst except that the summation is over randomly selected reflections excluded from the refinement.

Defined by procheck.