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. Author manuscript; available in PMC: 2017 Apr 1.
Published in final edited form as: Ultramicroscopy. 2016 Feb 17;163:75–86. doi: 10.1016/j.ultramic.2016.02.001

Table 3.

Information Depths for CRM in Si

(a) (b)Green and Keevers [53] (b)Dash and Newman [52]
λin (nm) λout (nm) din (nm) dout (nm) dCRM (nm) din (nm) dout (nm) dCRM (nm)
405 414 127 167 72 156 192 86
488 501 764 910 415 744 862 399
532 547 1302 1522 702 1184 1351 631
633 655 3125 3700 1694 2606 3067 1409
(a)

Vacuum wavelengths of excitation light, λin, and Raman scattered light, λout.

(b)

Ingoing and outgoing attenuation lengths, din and dout, and calculated information depths, dCRM.