. 2016 Jun 29;11:315. doi: 10.1186/s11671-016-1539-x
© The Author(s). 2016
Open AccessThis article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made.
Fig. 4.
Depth profile on a silicon wafer to evaluate the sampling volume (Bν)