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. 2016 Jun 30;6:29016. doi: 10.1038/srep29016

Figure 2.

Figure 2

High-resolution XPS spectra showing the binding energy of (a) Mo 3d and (b) S 2p electrons. Scanning auger electron spectroscopy (AES) images of MoS2 films deposited on Si substrates mapping the elemental distribution for (c) Mo, (d) S and (e) Si recorded in the same region.