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. 2016 Jun 30;6:29103. doi: 10.1038/srep29103

Figure 1. Illustration of terahertz transmission through a slit, represented as an impedance measurement with a current source, which is provided by the incident terahertz pulse.

Figure 1

A dark-field optical microscope image and transmission electron micrographs of the nano- and angstrom-gap slits are shown on the right.