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. 2016 Jul 12;5:e15155. doi: 10.7554/eLife.15155

Table 1.

Fitting parameters for the gap-derived strand memory experiment.

DOI: http://dx.doi.org/10.7554/eLife.15155.024

%gap [95% Confidence Interval] %A→G repair [95% Confidence Interval]
t1/2 (min) %gap at 0 min R2 t1/2 (min) %repair at 0 min R2
ΔMutS/MutL 0.60 [0.51−0.73] 100 [96.7−103.3] 0.99 1.87 [1.52−2.45] 74.8 [68.6−80.7] 0.97
ΔMutS 0.68 [0.58−0.81] 100 [96.4−103.5] 0.99 2.00 [1.76−2.31] 82.8 [79.0−86.6] 0.99
ΔMutL 0.75 [0.66−0.88] 100 [96.5−103.5] 0.99 39.6 [12.3− +∞] 72.8 [63.6−81.9] 0.80

Parameters for the one-phase exponential decay fitting of the data described in Figure 7B and D are presented. %gap: percentage of remaining gaps (100 - %closed), t1/2: half-life, R2: coefficient of determination. n = 3. Curve fitting was carried out using the GraphPad Prism 6 software (GraphPad Software, CA, USA).