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. 2016 Jul 15;12(7):e1004939. doi: 10.1371/journal.pcbi.1004939

Fig 9. Scatter of the upper-tail probabilities of the two tests in the presence of a repeated SSE.

Fig 9

The upper tail probability of the first test (y-axis) in relation to that of the second test (x-axis) for all models 0, …, 9. Each model is repeated 100 times and in each repetition an SSE composed of 7 links and 5 neurons/link is injected at two random points in time. The represented values max(1 − Pik, jk) and max(1 − Jik, jk) are taken each as the maximum (i.e. least significant) significance value across all entries SDS:={(ik,jk),k=1,2,,7} of the intersection matrix composing the embedded DS. The figure shows for each model the cloud of the 100 points (max(1 − Jik, jk), max(1 − Pik, jk)), one per simulation. The red lines mark the significance levels 1 − α1 (horizontal) and 1 − α2 (vertical) for individual tail probability values 1 − Pij and tail joint probability values 1 − Jij, respectively.