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. 2016 Jul 15;12(7):e1004939. doi: 10.1371/journal.pcbi.1004939

Fig 14. Performance as a function of lSSE, ξSSE and N.

Fig 14

(A) Average number of TP SSEs (over 100 model simulations) found in data where an SSE with varying number of links (horizontal axis, from 3 to 7) and neurons per link (vertical axis, from 2 to 5) is injected twice in the activity of N otherwise independent spike trains (model 0). N varies from 50 to 500 (top to bottom panels). For N = 100 the cross at position (lSSE = 7, ξSSE = 5) marks the parameters used in the previous calibrations. (B) Average number of events of the embedded SSE contained in each found SSE (“true positive events”). (C) Average number of FP SSEs (note the different scale of the color map). A FP can either be completely disjoint from the true embedded SSE, or contain part (or all) of its member events (see definition above and Fig 10). (D) Average number of found SSEs completely disjoint from the embedded one.