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. 2016 Jun 16;7(7):2650–2670. doi: 10.1364/BOE.7.002650

Fig. 2.

Fig. 2

(a) Schematic diagram of a thin film of thickness d (medium 2) on a substrate (medium 3) and of the propagation paths contributing to the total reflection coefficient. (b) Reflectance at normal incidence of an SU-8 photoresist film deposited on a silicon substrate.