Skip to main content
. 2016 Jul 22;6:30113. doi: 10.1038/srep30113

Figure 8.

Figure 8

(a) XPS etching by way of a beam of 5 kV Ar-ion for: (a) sequentially sputtered FeOx/TiO2-PE film (1) Ti2p, (2) Fe2p and (3) O1s and (b) co-sputtered FeOx-TiO2-PE film showing the atomic percentage concentration of atoms (1) Ti2p, (2) Fe2p and (3) O1s in the topmost layers (2 nm) as a function of penetration depth.