Figure 1. Atomic resolution STM images of native point defects in MoS₂ single layers.

(a) Atomic resolution STM image (V_b = 50 mV, I_t = 2 nA) clearly resolving individual point defects (dark triangles) present in a high (10¹³ cm⁻²) native concentration in mechanically exfoliated MoS₂ single layers on Au (111) substrate. (b) Line cuts displaying the atomic corrugation along the lines marked in panel (a) and revealing that the imaged defects (dark triangles) are centered on the position of an empty sulfur lattice site, indicating their S atom vacancy nature.